STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

Authors :: Kazutoshi Kaji
Takeshi Sunaoshi
C.T. Schamp
Yoshihisa Orai
Edgar Voelkl
Source :: Microscopy and Microanalysis. 22:604-605
Publication Year :: 2016
Publisher :: Oxford University Press (OUP), 2016.

Subjects :: 010302 applied physics
Surface (mathematics)
Materials science
Graphene
Nanotechnology
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
law.invention
Nanomaterials
Atomic resolution
law
0103 physical sciences
0210 nano-technology
Instrumentation

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