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Degradation Detection Methods for Electric Circuits

Authors :
Hiroshi Inujima
Uichi Kichijima
Source :
IEEJ Transactions on Electronics, Information and Systems. 109:499-506
Publication Year :
1989
Publisher :
Institute of Electrical Engineers of Japan (IEE Japan), 1989.

Subjects

Subjects :
Materials science
business.industry
Optoelectronics
Electrical and Electronic Engineering
business
Degradation (telecommunications)
Electronic circuit

Details

ISSN :
13488155 and 03854221
Volume :
109
Database :
OpenAIRE
Journal :
IEEJ Transactions on Electronics, Information and Systems
Accession number :
edsair.doi...........63c8dddd157866f3a7d4a5ec8f51de46
Full Text :
https://doi.org/10.1541/ieejeiss1987.109.7_499
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