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Optical spectroscopy of semiconductor surfaces: From differential reflectivity to reflection anisotropy spectroscopy (personal and subjective notes)
- Source :
- Il Nuovo Cimento D. 20:1047-1054
- Publication Year :
- 1998
- Publisher :
- Springer Science and Business Media LLC, 1998.
-
Abstract
- An historical review of the development of optical spectroscopy of surface states in semiconductors is presented. The importance of symmetry considerations and of polarization properties is emphasized.
Details
- ISSN :
- 18269893 and 03926737
- Volume :
- 20
- Database :
- OpenAIRE
- Journal :
- Il Nuovo Cimento D
- Accession number :
- edsair.doi...........631220bb397d485242fe4328fcfd4d90