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Optical spectroscopy of semiconductor surfaces: From differential reflectivity to reflection anisotropy spectroscopy (personal and subjective notes)

Authors :
V. I. Safarov
Source :
Il Nuovo Cimento D. 20:1047-1054
Publication Year :
1998
Publisher :
Springer Science and Business Media LLC, 1998.

Abstract

An historical review of the development of optical spectroscopy of surface states in semiconductors is presented. The importance of symmetry considerations and of polarization properties is emphasized.

Details

ISSN :
18269893 and 03926737
Volume :
20
Database :
OpenAIRE
Journal :
Il Nuovo Cimento D
Accession number :
edsair.doi...........631220bb397d485242fe4328fcfd4d90