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Inspection of all beams in multielectron beam system

Authors :
Kazuhiko Kato
Masakazu Sugaya
Kenji Tamamori
Masato Muraki
Yasunari Sohda
Sayaka Tanimoto
Akihiro Furukawa
Yasuhiro Someda
Futoshi Hirose
Kenichi Nagae
Masaki Hosoda
Source :
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 25:380
Publication Year :
2007
Publisher :
American Vacuum Society, 2007.

Abstract

A testing apparatus for inspecting the beams formed by a multisource module (MSM) was built for the feasibility study of a beam splitting array (BSA), a multielectron beam system the authors are developing. In this BSA, the MSM plays the following three key roles: splitting the beam from a single cathode into 32×32 beams, converging the 32×32 beams, and blanking them individually. Accordingly, the inspection of all beams formed by the MSM is essential for the feasibility study of the system. The testing apparatus was therefore designed for measuring all the beams formed by the MSM without demagnifying them. To maintain the accuracy during the inspection of all 32×32 beams, the measurement process was automated. This testing apparatus was used to measure the diameters and misalignments of all beams formed by a prototype MSM. As a result, the mean values of the transverse and the longitudinal diameters were found to be 0.88 and 0.92μm, respectively. A single stigmator can cancel the difference between these...

Details

ISSN :
10711023
Volume :
25
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Accession number :
edsair.doi...........62c37a568fe6aee39f8b386b32d6a256
Full Text :
https://doi.org/10.1116/1.2647279