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Advanced Measurement and Simulation Approach for DDR5 On-chip SI/PI with the Probing Package

Authors :
WonSuk Choi
SangKeun Kwak
Jaeseok Park
Jiyoung Do
Byeongseon Yun
Yoo-Jeong Kwon
Dongyeop Kim
Kyudong Lee
Tae Young Kim
Wonyoung Kim
Kyoungsun Kim
Sung Joo Park
Jeonghyeon Cho
Hoyoung Song
Source :
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
Accession number :
edsair.doi...........61ffcc22d959748a2c56544fffc34621
Full Text :
https://doi.org/10.1109/epeps53828.2022.9947122