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Effect of ammoniating temperature on structural and morphologic properties of nanostructured GaN

Authors :
Baoli Li
Huizhao Zhuang
Chengshan Xue
Jiabing Shen
Shiying Zhang
Dexiao Wang
Source :
Microelectronics Journal. 39:807-811
Publication Year :
2008
Publisher :
Elsevier BV, 2008.

Abstract

Nanostructured GaN was synthesized by ammoniating Ga"2O"3/Mo films at different temperatures in a quartz tube. The as-synthesized GaN was studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM) and Fourier transform infrared (FTIR) spectroscopy. The results show that the nanostructured material is single-crystal GaN with hexagonal wurtzite structure. The ammoniating temperature of the samples has an evident effect on the morphology and structure of the nanostructured GaN synthesized by this method. Lower temperature promotes the growth of wire-like structures and higher temperature facilitates the formation of the sheet-like structure. The growth mechanism of the nanostructured GaN was also discussed.

Details

ISSN :
00262692
Volume :
39
Database :
OpenAIRE
Journal :
Microelectronics Journal
Accession number :
edsair.doi...........5f7b937145f5f8f94e4a44bba9ecf6e9
Full Text :
https://doi.org/10.1016/j.mejo.2007.12.003