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Experiments of Homogenization Field LDMOS With Trench-Stopped Depletion

Authors :
Wentong Zhang
Le Zhu
Fengrun Tian
Jie Luo
Nailong He
Zhili Zhang
Sen Zhang
Jinping Zhang
Ming Qiao
Zhaoji Li
Bo Zhang
Source :
IEEE Transactions on Electron Devices. 69:2528-2533
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
15579646 and 00189383
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........5f74d12237b1ffa646a24ff8b9810f87