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Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films
- Source :
- Journal of Materials Science: Materials in Electronics. 29:3808-3816
- Publication Year :
- 2017
- Publisher :
- Springer Science and Business Media LLC, 2017.
-
Abstract
- In the present work, layered WO3/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO3 respectively. Raman analysis confirms the formation of layered WO3/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO3/ZnO consists of nano balls like morphology. The specific surface area of the layered WO3/ZnO thin film is found to be 65.12 m2 g−1. The photoelectrocatalytic degradation properties of layered WO3/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO3/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination.
- Subjects :
- 010302 applied physics
Materials science
02 engineering and technology
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
law.invention
symbols.namesake
Chemical engineering
law
Specific surface area
0103 physical sciences
Nano
Solar cell
symbols
Electrical and Electronic Engineering
Thin film
0210 nano-technology
Spectroscopy
Raman spectroscopy
Pyrolysis
Monoclinic crystal system
Subjects
Details
- ISSN :
- 1573482X and 09574522
- Volume :
- 29
- Database :
- OpenAIRE
- Journal :
- Journal of Materials Science: Materials in Electronics
- Accession number :
- edsair.doi...........5f2b1336bc7745fde7866fcac977b2ac
- Full Text :
- https://doi.org/10.1007/s10854-017-8316-1