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VI. Electron distribution in electron-optically focused electron beams

Authors :
L. Jacob
Source :
The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science. 28:81-98
Publication Year :
1939
Publisher :
Informa UK Limited, 1939.

Subjects

Subjects :
Materials science
Electron spectrometer
Reflection high-energy electron diffraction
Scanning electron microscope
law
Electron
Electron beam-induced deposition
Atomic physics
Electron microscope
Focused ion beam
Electron distribution
law.invention

Details

ISSN :
19415990 and 19415982
Volume :
28
Database :
OpenAIRE
Journal :
The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science
Accession number :
edsair.doi...........5f21c504837a8e05443ed4836213a118
Full Text :
https://doi.org/10.1080/14786443908521164
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