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Recent advances in 3D VLSI integration

Authors :
M. Brocard
Perrine Batude
J. Micout
Sebastien Thuries
P. Besombes
V. Mazzocchi
Laurent Brunet
Francois Andrieu
O. Billoint
C. Fenouillet-Beranger
M.-P. Samson
G. Cibrario
M. Vinet
N. Rambal
F. Deprat
Bernard Previtali
C-M. V. Lu
Source :
ICICDT
Publication Year :
2016
Publisher :
IEEE, 2016.

Abstract

This work highlights recent advances in 3D VLSI integration. A review of low temperature process modules development such as junctions, spacers and salicidation is presented. Finally, for the first time, a full CMOS over CMOS 3D VLSI integration on 300mm wafers is demonstrated with a top level compatible with state of the art high performance FDSOI (Fully-Depleted Silicon On Insulator) process requirements such as High-k/metal gate or raised source and drain.

Details

Database :
OpenAIRE
Journal :
2016 International Conference on IC Design and Technology (ICICDT)
Accession number :
edsair.doi...........5f0c6f566e2cddbec2a6f57b8a8cf2e8