Cite
Possibility to read out 20-nm-sized pits using a near-field optical probe in an atomic force cantilevered snom
MLA
Keisuke Shimada, et al. “Possibility to Read out 20-Nm-Sized Pits Using a near-Field Optical Probe in an Atomic Force Cantilevered Snom.” 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings, Jan. 2006. EBSCOhost, https://doi.org/10.1109/icsict.2006.306676.
APA
Keisuke Shimada, Kentaro Mine, Masahiro Asai, Sumio Hosaka, & Hayato. (2006). Possibility to read out 20-nm-sized pits using a near-field optical probe in an atomic force cantilevered snom. 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings. https://doi.org/10.1109/icsict.2006.306676
Chicago
Keisuke Shimada, Kentaro Mine, Masahiro Asai, Sumio Hosaka, and Hayato. 2006. “Possibility to Read out 20-Nm-Sized Pits Using a near-Field Optical Probe in an Atomic Force Cantilevered Snom.” 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings, January. doi:10.1109/icsict.2006.306676.