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A Method for Measuring Interface Roughness from Cross-Sectional Micrographs

Authors :
Shreyas Balachandran
David B. Smathers
Jiman Kim
Kihong Sim
Peter J. Lee
Source :
IEEE Transactions on Applied Superconductivity. 33:1-5
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

Details

ISSN :
23787074 and 10518223
Volume :
33
Database :
OpenAIRE
Journal :
IEEE Transactions on Applied Superconductivity
Accession number :
edsair.doi...........5d4152431fd5310cd7ad1fcce28163d1
Full Text :
https://doi.org/10.1109/tasc.2023.3250165
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