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Temperature-Aware Placement for SOCs
- Source :
- Proceedings of the IEEE. 94:1502-1518
- Publication Year :
- 2006
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2006.
-
Abstract
- Dramatic rises in the power consumption and integration density of contemporary systems-on-chip (SoCs) have led to the need for careful attention to chip-level thermal integrity. High temperatures or uneven temperature distributions may result not only in reliability issues, but also timing failures, due to the temperature-dependent nature of chip time-to-failure and delay, respectively. To resolve these issues, high-quality, accurate thermal modeling and analysis, and thermally oriented placement optimizations, are essential prior to tapeout. This paper first presents an overview of thermal modeling and simulation methods, such as finite-difference time domain, finite element, model reduction, random walk, and Green-function based algorithms, that are appropriate for use in placement algorithms. Next, two-dimensional and three-dimensional thermal-aware placement algorithms such as matrix-synthesis, simulated annealing, partition-driven, and force directed are presented. Finally, future trends and challenges are described
- Subjects :
- Engineering
business.industry
Hardware_PERFORMANCEANDRELIABILITY
Chip
Reliability engineering
Modeling and simulation
Reliability (semiconductor)
Simulated annealing
Hardware_INTEGRATEDCIRCUITS
Electronic engineering
System on a chip
Time domain
Electrical and Electronic Engineering
Physical design
business
Placement
Subjects
Details
- ISSN :
- 15582256 and 00189219
- Volume :
- 94
- Database :
- OpenAIRE
- Journal :
- Proceedings of the IEEE
- Accession number :
- edsair.doi...........5ce32f49f49252818bfb191d706cdcd3
- Full Text :
- https://doi.org/10.1109/jproc.2006.879804