Back to Search Start Over

Characterization of Pt/TiO2 surfaces by means of photoelectron spectroscopy of adsorbed xenon

Authors :
P. Dolle
K. Markert
K. S. Kim
Neal R. Armstrong
W. Heichler
Klaus Wandelt
R. A. Fiato
Source :
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:1465-1466
Publication Year :
1986
Publisher :
American Vacuum Society, 1986.

Abstract

Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO2 (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850 °C) in vacuum produce a distribution of (high charge density) surface defect sites, most likely Ti3+ and Ti2+, whose local surface potentials are higher than on a stoichiometric TiO2 surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO2 exhibits much lower local surface potentials (0.5–1 eV) than sputter‐roughened bulk Pt, suggesting modified charge densities at these sites.

Details

ISSN :
15208559 and 07342101
Volume :
4
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Accession number :
edsair.doi...........5cdb527119e2683b24f46c810f41b217
Full Text :
https://doi.org/10.1116/1.573538