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Surface Metrology and Data Science/Analytics Applied to Modern Asian Lacquer Surfaces

Authors :
Marianne Webb
H. David Sheets
Patrick Ravines
Source :
Archiving Conference. 18:71-75
Publication Year :
2021
Publisher :
Society for Imaging Science & Technology, 2021.

Details

ISSN :
21618798
Volume :
18
Database :
OpenAIRE
Journal :
Archiving Conference
Accession number :
edsair.doi...........5ccb687fe4301a9c5307fc6dde2e2b3a