Cold-Atom Ion Sources for Focused Ion Beam Applications

Authors :: Vladimir P. Oleshko
Nikolai B. Zhitenev
Thomas Michels
O. Kirilov
Andrew Schwarzkopf
Jabez J. McClelland
B. Knuffman
Adam V. Steele
W. R. McGehee
Christopher L. Soles
Evgheni Strelcov
David J. Gundlach
Vladimir A. Aksyuk
Saya Takeuchi
Source :: Microscopy and Microanalysis. 23:276-277
Publication Year :: 2017
Publisher :: Oxford University Press (OUP), 2017.

Subjects :: 010302 applied physics
Materials science
Ion beam
Ultracold atom
0103 physical sciences
02 engineering and technology
Atomic physics
021001 nanoscience & nanotechnology
0210 nano-technology
01 natural sciences
Instrumentation
Focused ion beam
Ion

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