Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy

MLA

Huayong Pan, et al. “Microstructural and Compositional Characterization of a New Silicon Carbide Nanocables Using Scanning Transmission Electron Microscopy.” Physica E: Low-Dimensional Systems and Nanostructures, vol. 15, Sept. 2002, pp. 1–5. EBSCOhost, https://doi.org/10.1016/s1386-9477(02)00444-7.

APA

Huayong Pan, Yamin Leprince-Wang, Dapeng Yu, M Tence, & Yingjie Xing. (2002). Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy. Physica E: Low-Dimensional Systems and Nanostructures, 15, 1–5. https://doi.org/10.1016/s1386-9477(02)00444-7

Chicago

Huayong Pan, Yamin Leprince-Wang, Dapeng Yu, M Tence, and Yingjie Xing. 2002. “Microstructural and Compositional Characterization of a New Silicon Carbide Nanocables Using Scanning Transmission Electron Microscopy.” Physica E: Low-Dimensional Systems and Nanostructures 15 (September): 1–5. doi:10.1016/s1386-9477(02)00444-7.