Cite
Temperature influence on analog figures-of-merit of nanosheet nMOSFET devices for sub-7nm technology node
MLA
Paula Ghedini Der Agopian, et al. “Temperature Influence on Analog Figures-of-Merit of Nanosheet NMOSFET Devices for Sub-7nm Technology Node.” 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Sept. 2020. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........5b777d3d7b6dc7276d2a9676f3491952&authtype=sso&custid=ns315887.
APA
Paula Ghedini Der Agopian, Welder F. Perina, Eddy Simoen, Anabela Veloso, Vanessa C. P. Silva, & Joao Antonio Martino. (2020). Temperature influence on analog figures-of-merit of nanosheet nMOSFET devices for sub-7nm technology node. 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
Chicago
Paula Ghedini Der Agopian, Welder F. Perina, Eddy Simoen, Anabela Veloso, Vanessa C. P. Silva, and Joao Antonio Martino. 2020. “Temperature Influence on Analog Figures-of-Merit of Nanosheet NMOSFET Devices for Sub-7nm Technology Node.” 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), September. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........5b777d3d7b6dc7276d2a9676f3491952&authtype=sso&custid=ns315887.