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65.4: Active Matrix PHOLED Displays on Temporary Bonded Polyethylene Naphthalate Substrates with 180 °C a-Si:H TFTs

Authors :
E. J. Bawolek
Michael Hack
Yong Kyun Lee
Shawn M. O'Rourke
Doug Loy
Curt Moyer
Julie J. Brown
David C. Morton
Eric Forsythe
Nick Colaneri
Mark Richards
Kamala Rajan
Cynthia Bell
Jeff Silvernail
Sameer M. Venugopal
Michael Marrs
Jann Kaminski
Ruiqing Ma
Scott K. Ageno
Source :
SID Symposium Digest of Technical Papers. 40:988
Publication Year :
2009
Publisher :
Wiley, 2009.

Abstract

A low temperature, 180 °C, amorphous Si (a-Si:H) process on bonded polyethylene naphthalate substrates is discussed and a 4.1-inch QVGA active matrix (AM) phosphorescent OLED display is demonstrated. The n-channel thin-film transistors (TFTs) exhibited saturation mobilities of 0.773 cm2/V-sec, layer to layer registration distortion less than 10ppm and low defectivity. The efficiency of the OLED display is 39 cd/A at 500 nits.

Details

ISSN :
0097966X
Volume :
40
Database :
OpenAIRE
Journal :
SID Symposium Digest of Technical Papers
Accession number :
edsair.doi...........5ab4397f70c4f67dcbbfa1db6ccd426c
Full Text :
https://doi.org/10.1889/1.3256966