Analysis of the correlation betweenn-value and critical current in bent multifilamentary Bi2223 composite tape based on a damage evolution model

MLA

Kozo Osamura, et al. “Analysis of the Correlation Betweenn-Value and Critical Current in Bent Multifilamentary Bi2223 Composite Tape Based on a Damage Evolution Model.” Superconductor Science and Technology, vol. 25, Apr. 2012, p. 054016. EBSCOhost, https://doi.org/10.1088/0953-2048/25/5/054016.

APA

Kozo Osamura, S.S. Oh, Masahiro Fujimoto, Shojiro Ochiai, Dong-Woo Ha, Masaki Hojo, Michinaka Sugano, Hiroshi Okuda, & J.K. Shin. (2012). Analysis of the correlation betweenn-value and critical current in bent multifilamentary Bi2223 composite tape based on a damage evolution model. Superconductor Science and Technology, 25, 054016. https://doi.org/10.1088/0953-2048/25/5/054016

Chicago

Kozo Osamura, S.S. Oh, Masahiro Fujimoto, Shojiro Ochiai, Dong-Woo Ha, Masaki Hojo, Michinaka Sugano, Hiroshi Okuda, and J.K. Shin. 2012. “Analysis of the Correlation Betweenn-Value and Critical Current in Bent Multifilamentary Bi2223 Composite Tape Based on a Damage Evolution Model.” Superconductor Science and Technology 25 (April): 054016. doi:10.1088/0953-2048/25/5/054016.