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Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application

Authors :
Maryla Wasiolek
Narayana P. Bhat
Biswajit Ray
Preeti Kumari
Khalid Hattar
Umeshwarnath Surendranathan
Source :
IEEE Transactions on Nuclear Science. 69:478-484
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects

Subjects :
Nuclear and High Energy Physics
Flash (photography)
Bit (horse)
Nuclear Energy and Engineering
business.industry
Computer science
NAND gate
Dosimetry
Electrical and Electronic Engineering
business
Computer hardware

Details

ISSN :
15581578 and 00189499
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........589e85c919e36515aee67b59ba95b087

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