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First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications

Authors :
H. Wu
V. Katragadda
E. Evarts
E. Edwards
R. Southwick
A. Dutta
G. Lauer
V. Mehta
R. Johnson
O. van der Straten
A. Reznicek
M. Wordeman
M. Rizzolo
R. Patlolla
D. Metzler
C. Yang
D. Edelstein
D. Canaperi
S. Teehan
J.M. Slaughter
D.C. Worledge
Source :
2021 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........5859f04041fcace30727c2e609d802a5

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