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The Effect of Ion-Beam Bombardment on Solution-Processed Nickel Oxide Films Used for Liquid Crystal Alignment

Authors :
Dong-Hyun Kim
Dong Wook Lee
Jeong Min Han
Jonghoon Won
Ju Hwan Lee
Hae Chang Jeong
Yun Gun Lee
Dae Shik Seo
Byeong Yun Oh
Source :
ECS Journal of Solid State Science and Technology. 8:R66-R69
Publication Year :
2019
Publisher :
The Electrochemical Society, 2019.

Details

ISSN :
21628777 and 21628769
Volume :
8
Database :
OpenAIRE
Journal :
ECS Journal of Solid State Science and Technology
Accession number :
edsair.doi...........58500daa8ff07987917349ca59542777
Full Text :
https://doi.org/10.1149/2.0081904jss