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Defects in Semiconductors
- Source :
- Journal of Applied Physics. 127:190401
- Publication Year :
- 2020
- Publisher :
- AIP Publishing, 2020.
Details
- ISSN :
- 10897550 and 00218979
- Volume :
- 127
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics
- Accession number :
- edsair.doi...........581e9846c7bdaa86b82b10c9199bf017