Surface oxidation of SnTe topological crystalline insulator

Authors :: R. Wojnarowska-Nowak
Andrzej Szczerbakow
A. Badyla
Nicolas Berchenko
R. Vitchev
Malgorzata Trzyna
Tomasz Story
Jozef Cebulski
Source :: Applied Surface Science. 452:134-140
Publication Year :: 2018
Publisher :: Elsevier BV, 2018.
Abstract: The composition of oxide layers that grow under air exposure at room temperature on the surface of SnTe monocrystals was studied by Raman spectroscopy, angle resolved X-ray photoelectron spectroscopy (ARXPS), and Time Of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS). It is established that a multilayered structure with a non-uniform depth distribution of components is formed. The main components of this structure are tin dioxide SnO2 and tellurium in three chemical states - elementary Te, tellurium dioxide TeO2 and tellurium suboxide TeOx (0

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