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Total ionizing dose test facilities for micro-electronic circuits

Authors :
R. Liu
Valeri Kirischian
H.-B. Wang
David M. Hiemstra
Li Chen
X.-T. Li
Source :
CCECE
Publication Year :
2016
Publisher :
IEEE, 2016.

Abstract

This paper describes the total ionizing dose test facility available at the University of Saskatchewan. Two Co-60 sources are available one for high and the other low dose rate radiation effects testing of electronics. The total ionizing dose performance of an operation amplifier was evaluated. The testing results compare well with previously published results.

Details

Database :
OpenAIRE
Journal :
2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)
Accession number :
edsair.doi...........577bc7953432c205c2b5e2c5666b9f3e
Full Text :
https://doi.org/10.1109/ccece.2016.7726602