Back to Search
Start Over
Fabrication and characterization of heterostructures with subnanometer thickness
- Source :
- Microelectronic Engineering. 2:129-136
- Publication Year :
- 1984
- Publisher :
- Elsevier BV, 1984.
-
Abstract
- Good quality of heterostructures with subnanometer thickness have been successfully grown for the first time with van der Waals epitaxy. The van der Waals epitaxy can be realized in the materials having no dangling bonds on their clean surfaces, on which epitaxial growth proceeds by the van der Waals force. We have succeeded to grow ultrathin selenium film on a cleaved face of tellurium and ultrathin NbSe 2 film on a cleaved face of 2H-MoS 2 by making full use of the van der Waals epitaxy. Although there exists lattice mismatching as large as 20 % between those materials forming the heterostructure, the grown film has been proved to be good single crystalline one having a lattice constant of its own even in the first atomic layer at the interface.
- Subjects :
- Fabrication
Materials science
business.industry
Dangling bond
chemistry.chemical_element
Heterojunction
Nanotechnology
Condensed Matter Physics
Epitaxy
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
symbols.namesake
Lattice constant
chemistry
Lattice (order)
symbols
Optoelectronics
Electrical and Electronic Engineering
van der Waals force
Tellurium
business
Subjects
Details
- ISSN :
- 01679317
- Volume :
- 2
- Database :
- OpenAIRE
- Journal :
- Microelectronic Engineering
- Accession number :
- edsair.doi...........574bf1788c3510bbc96f984c95f8dfa8
- Full Text :
- https://doi.org/10.1016/0167-9317(84)90057-1