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Important research targets to be explored for β-FeSi2 device making

Authors :
Naotaka Otogawa
Yasuhiro Fukuzawa
Takahiro Mise
Masato Osamura
Hisao Tanoue
Yasuhito Suzuki
Teruhisa Ootsuka
Yasuhiko Nakayama
Yunosuke Makita
Shinan Wang
Z.X Liu
Source :
Thin Solid Films. 461:202-208
Publication Year :
2004
Publisher :
Elsevier BV, 2004.

Abstract

To place β-FeSi 2 as a 3rd generation Kankyo (Environmentally Friendly) Semiconductor after GaAs, one should demonstrate its superior features by fabricating practical devices. One has to prepare high-quality β-FeSi 2 films with (1) precisely controlled Fe/Si ratio (1:2), (2) flat and cracks-free surface, (3) pinhole-free surface and interfaces, (4) flat interfaces, (5) well-controlled electron or hole concentration with residual carrier concentration as low as ∼10 16 cm −3 . One should accordingly explore novel thin film manufacturing technologies by considering specific properties of constituent Fe and Si atoms. Conventional growth methods used for III–V and II–VI compound semiconductor films are not suited for β-FeSi 2 . Here we summarize the current status of film preparation technologies and describe their advantages and drawbacks. To explore the possibility of β-FeSi 2 for low cost and high conversion efficiency solar cells, high quality β-FeSi 2 films have been formed on Si substrates by molecular beam epitaxy (MBE) and sputtering methods. The critical feature about the device structure is an optimized thin β-FeSi 2 template buffer layer on Si(111) substrate. The template served as a substrate for epitaxial growth of single crystal β-FeSi 2 film and restrains the Fe diffusion into Si at β-FeSi 2 /Si interface. For n-β-FeSi 2 /p-Si structure under air mass 1.5, an energy conversion efficiency of 3.7% was obtained, showing that β-FeSi 2 is practically a promising semiconductor for making solar cells.

Details

ISSN :
00406090
Volume :
461
Database :
OpenAIRE
Journal :
Thin Solid Films
Accession number :
edsair.doi...........5597a12f3d38e2f02b007566d6cf5845
Full Text :
https://doi.org/10.1016/j.tsf.2004.02.073