Measurement of infrared refractive index based on angle location automatic recognition

Authors :: 吴越豪 Wu Yuehao
刘永兴 Liu Yongxing
胡向平 Hu Xiang-ping
张培晴 Zhang Peiqing
戴世勋 Dai Shixun
Source :: Optics and Precision Engineering. 26:300-306
Publication Year :: 2018
Publisher :: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2018.

Subjects :: Materials science
Optics
Infrared
business.industry
business
Refractive index
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

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