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BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

Authors :
Xavier Federspiel
E. Pion
D. Angot
M. Saliva
Y. Carminati
Vincent Huard
L. Rahhal
A. Bajolet
Antoine Cros
Alain Bravaix
Florian Cacho
Source :
2013 IEEE International Electron Devices Meeting.
Publication Year :
2013
Publisher :
IEEE, 2013.

Abstract

This paper presents understandings on BTI variability based upon an extensive dataset. This enables to select between various theoretical statistical models and to propose a novel description approach for the NBTI-induced mismatch for different technological nodes and a comparison with time-zero variability. The impact from transistor to gate level is also evaluated.

Details

Database :
OpenAIRE
Journal :
2013 IEEE International Electron Devices Meeting
Accession number :
edsair.doi...........5511b594049865601b3b261c312ac84e