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A Node-Level PathGraph-Based Bearing Remaining Useful Life Prediction Method

Authors :
Chaoying Yang
Jie Liu
Kaibo Zhou
Xingxing Jiang
Ming-Feng Ge
Yiben Liu
Source :
IEEE Transactions on Instrumentation and Measurement. 71:1-10
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects

Subjects :
Electrical and Electronic Engineering
Instrumentation

Details

ISSN :
15579662 and 00189456
Volume :
71
Database :
OpenAIRE
Journal :
IEEE Transactions on Instrumentation and Measurement
Accession number :
edsair.doi...........54ccc8005f953f94e4431035b75a4c17
Full Text :
https://doi.org/10.1109/tim.2022.3190526
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