Putting a New Spin on Scanning Transmission Electron Microscopy

Local atomic scale ordering and structural distortions can significantly modify material properties. Aberration correction dramatically improves spatial resolution into the sub-Angstrom regime, unlocking information about material defects previously beyond reach. While STEM has proven essential to the atomic scale characterization of materials, for example at defects, interfaces, or even in perfect crystals, measurement of atomic displacements and distances has remained challenging due to the presence of sample drift. Distortion proportional to the rate of sample drift during image acquisition hinders the accurate measurement or even representation of atomic structure. Though modern STEM installations are optimized to reduce vibration, air flow/fields, and temperature fluctuations, sample drift generally remains.