Crystal-momentum-resolved electronic structure of solids using resonant soft-X-ray fluorescence spectroscopy

Resonant inelastic X-ray scattering (RIXS) has been observed in graphite and hexagonal boron nitride (hBN) above and below their K edges. Below the core threshold, inelastic-loss features are observed, which disperse linearly with excitation energy, but as the excitation goes above the core binding energy, nonlinear dispersive effects are observed in graphite but not in hBN. We show that these two effects, which have previously been thought of as separate processes, i.e. resonant X-ray Raman scattering (below threshold) and RIXS (above threshold), are in fact described by the same physics of coherent fluorescence. Very good agreement between experiment and simulated RIXS is achieved using a simple one-electron framework. The role core-excitons play in the RIXS process is examined in finer detail, by using narrow-band excitation. Our results indicate that core-hole effects play a minor role in the RIXS observed from graphite but are more pronounced in hBN.