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The technology for integrating the static, dynamic and capacitance items of electrical testing in power module

Authors :
Heng-Lee
Tao-Chih Chang
Chih-Ming Tzeng
Source :
2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

This paper addresses the issue of designing testing platform with 1200V/600A IGBT P.M type power module and integrates lots of testing items such as static, dynamic and capacitance into one platform. The most challenge things are to overcome the interference between different testing items, high power protection and reduce implementing time. Therefore, we invent some methods to make our testing flow more quickly, protectable and easy to aim at the requirements of high efficiency, high reliability in testing all of the electrical properties during the small period of time.

Details

Database :
OpenAIRE
Journal :
2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
Accession number :
edsair.doi...........513b451e98bc877be9f5b271c8c33597