Influence of Water Condensation on Charge Transport and Electric Breakdown Between an Atomic Force Microscope Tip, Polymeric, and (Semiconductor) CdS Surfaces

Authors :: Sergei F. Lyuksyutov
Dmytro Kashyn
Pavel B. Paramonov
Ewa Rowicka
Ivan Dolog
Tadashi Hirano
Robert Mallik
Michael A. Reagan
Source :: Current Nanoscience. 4:166-172
Publication Year :: 2008
Publisher :: Bentham Science Publishers Ltd., 2008.

Subjects :: Kelvin probe force microscope
Chemistry
business.industry
Atomic force microscopy
Electrostatic force microscope
Biomedical Engineering
Pharmaceutical Science
Medicine (miscellaneous)
Bioengineering
Charge (physics)
Conductive atomic force microscopy
Local oxidation nanolithography
Semiconductor
Optoelectronics
Magnetic force microscope
Atomic physics
business
Biotechnology

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