Current-induced depairing in theBi2Te3/FeTeinterfacial superconductor

We investigated current induced depairing in the ${\mathrm{Bi}}_{2}{\mathrm{Te}}_{3}/\mathrm{FeTe}$ topological insulator-chalcogenide interface superconductor. The measured depairing current density provides information on the magnetic penetration depth and superfluid density, which in turn shed light on the nature of the normal state that underlies the interfacial superconductivity.