Microscopic nature of border traps in MOS oxides

MLA

J.R. Schwank, et al. “Microscopic Nature of Border Traps in MOS Oxides.” IEEE Transactions on Nuclear Science, vol. 41, Dec. 1994, pp. 1817–27. EBSCOhost, https://doi.org/10.1109/23.340513.

APA

J.R. Schwank, R. A. B. Devine, William L. Warren, Marty R. Shaneyfelt, P.S. Winokur, & Daniel M. Fleetwood. (1994). Microscopic nature of border traps in MOS oxides. IEEE Transactions on Nuclear Science, 41, 1817–1827. https://doi.org/10.1109/23.340513

Chicago

J.R. Schwank, R. A. B. Devine, William L. Warren, Marty R. Shaneyfelt, P.S. Winokur, and Daniel M. Fleetwood. 1994. “Microscopic Nature of Border Traps in MOS Oxides.” IEEE Transactions on Nuclear Science 41 (December): 1817–27. doi:10.1109/23.340513.