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IDS 5000: An integrated diagnostic system for VLSI
- Source :
- Microelectronic Engineering. 7:339-342
- Publication Year :
- 1987
- Publisher :
- Elsevier BV, 1987.
-
Abstract
- This paper describes the implementation of a mouse and window-driven Electron-Beam prober, intended for use by IC designers for debugging VLSI circuits. A worksation enables on-line access to the schematic, physical layout and test data, which is displayed in a format with which the designer is familiar so that little training is necessary to operate the system.
- Subjects :
- Very-large-scale integration
business.industry
Computer science
media_common.quotation_subject
Schematic
Condensed Matter Physics
Diagnostic system
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Debugging
Embedded system
Hardware_INTEGRATEDCIRCUITS
Electrical and Electronic Engineering
business
media_common
Test data
Subjects
Details
- ISSN :
- 01679317
- Volume :
- 7
- Database :
- OpenAIRE
- Journal :
- Microelectronic Engineering
- Accession number :
- edsair.doi...........4ede6b52d36186a362f8f735e65a66df