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Malicious attacks detection in crowded areas using deep learning-based approach
- Source :
- IEEE Instrumentation & Measurement Magazine. 23:57-62
- Publication Year :
- 2020
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2020.
- Subjects :
- Electrical and Electronic Engineering
Instrumentation
Subjects
Details
- ISSN :
- 19410123 and 10946969
- Volume :
- 23
- Database :
- OpenAIRE
- Journal :
- IEEE Instrumentation & Measurement Magazine
- Accession number :
- edsair.doi...........4e72e51d00f7bef0fde6a88573efa0ef