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Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness

Authors :
Yasuhiro Hattori
Yasushi Saitoh
Shigeru Sawada
Kazuo Iida
Terutaka Tamai
Tetsuya Ito
Source :
IEICE Transactions on Electronics. :1199-1205
Publication Year :
2008
Publisher :
Institute of Electronics, Information and Communications Engineers (IEICE), 2008.

Abstract

In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.

Details

ISSN :
17451353 and 09168524
Database :
OpenAIRE
Journal :
IEICE Transactions on Electronics
Accession number :
edsair.doi...........4e6ed8c547755702e88c64816cdab678
Full Text :
https://doi.org/10.1093/ietele/e91-c.8.1199