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Energy straggling of he ions in Al, Cu and Au from 0.25 to 0.75 MeV/amu
- Source :
- Radiation Effects. 60:111-117
- Publication Year :
- 1982
- Publisher :
- Informa UK Limited, 1982.
-
Abstract
- Straggling of He ions has been measured in thin films of aluminium, copper and gold by the backscattering technique at energies varying from 0.25 to 0.75 MeV/a.m.u. The results are compared with the predictions of the theories of Bohr, Bethe-Livingston and Lindhard-Scharff. There is a fair agreement with the Bethe-Livingston calculations.
- Subjects :
- Materials science
Scattering
General Engineering
chemistry.chemical_element
Mathematics::Geometric Topology
Copper
Charged particle
Bohr model
Ion
Condensed Matter::Materials Science
symbols.namesake
Ion implantation
chemistry
Physics::Plasma Physics
Aluminium
Condensed Matter::Superconductivity
symbols
Physics::Accelerator Physics
Atomic physics
Thin film
Subjects
Details
- ISSN :
- 00337579
- Volume :
- 60
- Database :
- OpenAIRE
- Journal :
- Radiation Effects
- Accession number :
- edsair.doi...........4e51c874a8c01020075f973f382853bd
- Full Text :
- https://doi.org/10.1080/00337578208242782