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Experimental designs of ballistic reversible logic gates using fluxons
- Source :
- 2019 IEEE International Superconductive Electronics Conference (ISEC).
- Publication Year :
- 2019
- Publisher :
- IEEE, 2019.
-
Abstract
- Compared to irreversible gate operations, reversible digital logic gates can provide a fundamental advantage in energy efficiency. Here we discuss previously discovered 1-bit ballistic reversible logic gates and new experimental plans to measure it. The gates consist of long Josephson junctions (LJJs) connected by a circuit interface. The gate dynamics evanescently extends into the LJJs to realize the physically resonant gate operation. It differs from known adiabatic superconducting gates because it does not work in the adiabatic limit. Depending on the gate type, that is the Identity or NOT gate, the polarity of the outgoing fluxon should be preserved or inverted, respectively. The dynamics of the scattering process, originally discovered in full numerical simulation, is understood using collective coordinate analysis. We plan to experimentally study how well a fluxon can travel ballistically towards the interface, and scatter with the designed gate operation. Here we present gate and SQUID-sensing layout designs for a NOT gate. The LJJ circuit layout uses niobium trilayer short junctions with connecting wiring for inductors. Part of the design includes the shunting capacitors at the gate interface which is key for the resonant dynamics in the gates.
- Subjects :
- Physics
Josephson effect
Fluxon
Hardware_PERFORMANCEANDRELIABILITY
Topology
Inductor
law.invention
Computer Science::Hardware Architecture
Capacitor
Computer Science::Emerging Technologies
law
Condensed Matter::Superconductivity
Logic gate
Hardware_INTEGRATEDCIRCUITS
Inverter
Hardware_ARITHMETICANDLOGICSTRUCTURES
Polarity (mutual inductance)
Hardware_LOGICDESIGN
Long Josephson junction
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2019 IEEE International Superconductive Electronics Conference (ISEC)
- Accession number :
- edsair.doi...........4e42b64912c3d97ba4c675f44ee0a325
- Full Text :
- https://doi.org/10.1109/isec46533.2019.8990914