Effects of Annealing Temperature and Nitrogen Content on Effective Work Function of Tungsten Nitride

MLA

Chih-Hsiung Huang, et al. “Effects of Annealing Temperature and Nitrogen Content on Effective Work Function of Tungsten Nitride.” IEEE Electron Device Letters, vol. 40, Aug. 2019, pp. 1237–40. EBSCOhost, https://doi.org/10.1109/led.2019.2922249.

APA

Chih-Hsiung Huang, Chee-Wee Liu, Chung-En Tsai, & Yu-Rui Chen. (2019). Effects of Annealing Temperature and Nitrogen Content on Effective Work Function of Tungsten Nitride. IEEE Electron Device Letters, 40, 1237–1240. https://doi.org/10.1109/led.2019.2922249

Chicago

Chih-Hsiung Huang, Chee-Wee Liu, Chung-En Tsai, and Yu-Rui Chen. 2019. “Effects of Annealing Temperature and Nitrogen Content on Effective Work Function of Tungsten Nitride.” IEEE Electron Device Letters 40 (August): 1237–40. doi:10.1109/led.2019.2922249.