Back to Search Start Over

Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN -on- Si Heterostructures and p - n Diodes by Multiple Microscopy Techniques

Authors :
Albert Minj
Karen Geens
Hu Liang
Han Han
Céline Noël
Benoit Bakeroot
Kristof Paredis
Ming Zhao
Thomas Hantschel
Stefaan Decoutere
Source :
Physical Review Applied. 19
Publication Year :
2023
Publisher :
American Physical Society (APS), 2023.

Subjects

Subjects :
General Physics and Astronomy

Details

ISSN :
23317019
Volume :
19
Database :
OpenAIRE
Journal :
Physical Review Applied
Accession number :
edsair.doi...........4de47323292a898a1eca10264eba254d
Full Text :
https://doi.org/10.1103/physrevapplied.19.034081
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details