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Layer Stacking Determination in Topological Semimetal MoTe2 via STEM Imaging, Liquid He TEM, and Quantitative Electron Diffraction
- Source :
- Microscopy and Microanalysis. 28:1746-1748
- Publication Year :
- 2022
- Publisher :
- Oxford University Press (OUP), 2022.
- Subjects :
- Instrumentation
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 28
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........4d2a3f86b06b8027380d13614dfbdf47
- Full Text :
- https://doi.org/10.1017/s1431927622006924