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Long Trace Profiler Based on Multiple-Beam Interference

Authors :
张巍 Zhang Wei
巩岩 Gong Yan
廖家胜 Liao Jiasheng
李晶 Li Jing
Source :
Acta Optica Sinica. 34:0323001
Publication Year :
2014
Publisher :
Shanghai Institute of Optics and Fine Mechanics, 2014.

Subjects

Subjects :
Trace (semiology)
Physics
Optics
business.industry
Multiple beam
business
Interference (wave propagation)
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Details

ISSN :
02532239
Volume :
34
Database :
OpenAIRE
Journal :
Acta Optica Sinica
Accession number :
edsair.doi...........4c089d2e4b29de5f41d09b841cee9422

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