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A Novel Approach of Data Content Zeroization Under Memory Attacks
- Source :
- Journal of Electronic Testing. 36:147-167
- Publication Year :
- 2020
- Publisher :
- Springer Science and Business Media LLC, 2020.
-
Abstract
- Protecting user’s secret data on the devices like smartphones, tablets, wearable devices etc, from memory attacks is always a challenge for system designers. The most stringent security requirements and protocols in today’s state-of-the-art systems are governed by Federal Information Processing Standards (FIPS). Specifically, it ensures the protection of sensitive data by erasing them from random access memories (RAMs) and associated flip-flip based registers, as soon as security violation(s) is(are) detected. Traditionally, the sensitive data like authentication credentials, cryptographic keys and other on-chip secrets are erased (or zeroized) by sequential write transactions initiated either by dedicated hardware or using software programs. This paper, for the first time, proposes a novel approach of erasing secured data content from on-chip RAMs using conventional memory built-in-self-test (MBIST) hardware in mission mode. The proposed zeroization approach is proved to be substantially faster than the traditional techniques in erasing data content. As it helps in re-using Memory BIST hardware for on-chip data content zeroization, this guarantees to save silicon area and power by removing dedicated conventional hardware from the device. This paper also discusses the micro-architectural implementation and security challenges of using Memory BIST hardware in mission mode and proposes practical solutions to fill the gaps.
- Subjects :
- Authentication
business.industry
Computer science
020208 electrical & electronic engineering
02 engineering and technology
020202 computer hardware & architecture
Software
Mode (computer interface)
Embedded system
0202 electrical engineering, electronic engineering, information engineering
Data content
Electrical and Electronic Engineering
Federal Information Processing Standards
business
Wearable technology
Conventional memory
Random access
Subjects
Details
- ISSN :
- 15730727 and 09238174
- Volume :
- 36
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Testing
- Accession number :
- edsair.doi...........4b2ad4cc97666ea185fa111529af6541
- Full Text :
- https://doi.org/10.1007/s10836-020-05867-4