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AWkS: adaptive, weighted k-means-based superpixels for improved saliency detection
- Source :
- Pattern Analysis and Applications. 24:625-639
- Publication Year :
- 2020
- Publisher :
- Springer Science and Business Media LLC, 2020.
-
Abstract
- Clustering inspired superpixel algorithms perform a restricted partitioning of an image, where each visually coherent region containing perceptually similar pixels serves as a primitive in subsequent processing stages. Simple linear iterative clustering (SLIC) has emerged as a standard superpixel generation tool due to its exceptional performance in terms of segmentation accuracy and speed. However, SLIC applies a manually adjusted distance measure for dis-similarity computation which directly affects the quality of superpixels. In this work, self-adjustable distance measures are adapted from the weighted k-means clustering (W-k-means) for generating superpixel segmentation. In the proposed distance measures, an adaptive weight associated with each variable reflects its relevance in the clustering process. Intuitively, the variable weights correspond to the normalization terms in SLIC that affect the trade-off between superpixels boundary adherence and compactness. Weights that influence consistency in superpixel generation are automatically updated. The variable weights update is accomplished during optimization with a closed-form solution based on the current image partition. The proposed adaptive, W-k-means-based superpixels (AWkS) experimented on three benchmarks under different distance measure outperform the conventional SLIC algorithm with respect to various boundary adherence metrics. Finally, the effectiveness of the AWkS over SLIC is demonstrated for saliency detection.
- Subjects :
- Superpixel segmentation
Pixel
business.industry
Computer science
Computation
Normalization (image processing)
k-means clustering
020207 software engineering
Pattern recognition
02 engineering and technology
Distance measures
Artificial Intelligence
0202 electrical engineering, electronic engineering, information engineering
020201 artificial intelligence & image processing
Segmentation
Computer Vision and Pattern Recognition
Artificial intelligence
business
Cluster analysis
Subjects
Details
- ISSN :
- 1433755X and 14337541
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Pattern Analysis and Applications
- Accession number :
- edsair.doi...........4a9107d5dd8a66955f81ce19a674e434
- Full Text :
- https://doi.org/10.1007/s10044-020-00925-1