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Scanning Electron Microscopy With Slow Electrons

Authors :
Ilona Müllerová
Luděk Frank
Šárka Mikmeková
Zuzana Pokorná
Source :
Microscopy and Microanalysis. 19:372-373
Publication Year :
2013
Publisher :
Oxford University Press (OUP), 2013.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Subjects

Subjects :
Materials science
Reflection high-energy electron diffraction
business.industry
Scanning electron microscope
Cryo-electron microscopy
Scanning transmission electron microscopy
Scanning confocal electron microscopy
Optoelectronics
Energy filtered transmission electron microscopy
Electron
Electron beam-induced deposition
business
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
19
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........49f1c15923a4d5700d41df5894fbaeb6
Full Text :
https://doi.org/10.1017/s1431927613003851
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