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Influence of substrate properties on sample preparation for investigations by methods sensitive to surface properties

Authors :
A A Ishpaeva
A M Lyakhovich
V L Vorobyov
N F Kashapov
Source :
Journal of Physics: Conference Series. 2379:012020
Publication Year :
2022
Publisher :
IOP Publishing, 2022.

Abstract

The paper considers the influence of the substrate polarity on the preparation of samples from sols for examination by X-ray photoelectron spectroscopy and atomic force microscopy.

Subjects

Subjects :
History
Computer Science Applications
Education

Details

ISSN :
17426596 and 17426588
Volume :
2379
Database :
OpenAIRE
Journal :
Journal of Physics: Conference Series
Accession number :
edsair.doi...........49bb019baf1d2b0c76271be8274fd123
Full Text :
https://doi.org/10.1088/1742-6596/2379/1/012020
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